Machine Vision Knowledge Base: Lens Selection and Application Guides
Knowledge
Optical Surface Profiler Guide: WLI vs Point Confocal vs Focus Variation | POMEAS
Optical surface profiler guide: WLI vs point confocal vs focus variation, PSI/VSI mode selection and WLI100 specs for 3D topography and roughness.
PCB AOI Lens Upgrade: 17.3 mm to 12 mm or 8 mm FOV
Keep your AOI camera and light, shrink the field of view from 17.3 x 17.3 mm to 12 x 12 or 8 x 8 mm. The magnification maths, lens routes and WD cost.
Optical Metrology OEM Modules: Design-to-Production Verification Checklist
A six-gate qualification path for optical metrology modules, from optical feasibility to change control, with the specification fields that actually transfer.
Robotic At-Line Metrology: When to Add a Camera-Based Optical Station
When a camera optical station earns its place beside a robot arm: uncertainty budget, depth of field, cycle time and interface ownership.
HBM and WLP Inspection: Separate 3D Metrology from 2D Defect Review
Why 3D height metrology and 2D defect review need separate optical chains in HBM and WLP lines, with NA, sampling and depth-of-field arithmetic.
Glass Core TGV Inspection: Surface AOI vs Subsurface Crack Detection
Why a visible-light AOI station and a 1200-1800 nm crack system stay separate tools, with field arithmetic for TGV panels, ABF build-up and via taper.
Flash Measurement System for PCB Inspection
Single-exposure PCB measurement: which board sizes fit a 300 x 200 mm field, why repeatability is not accuracy, and where AOI takes over.
Zoom Lens for Machined Parts: One Camera, Several Magnifications
How a motorized zoom lens covers machined part families: sizing magnification from the part envelope, stand-off in the enclosure and depth of field versus feature height.
Flash Measurement System for Semiconductor Wafer Inspection
Single-field flash measurement on wafers: dual-magnification telecentric optics, field calibration, the 0.02L accuracy term, and where a 300 mm wafer stops fitting.
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