Machine Vision Knowledge Base: Lens Selection and Application Guides
Knowledge
Robotic At-Line Metrology: When to Add a Camera-Based Optical Station
When a camera optical station earns its place beside a robot arm: uncertainty budget, depth of field, cycle time and interface ownership.
HBM and WLP Inspection: Separate 3D Metrology from 2D Defect Review
Why 3D height metrology and 2D defect review need separate optical chains in HBM and WLP lines, with NA, sampling and depth-of-field arithmetic.
Glass Core TGV Inspection: Surface AOI vs Subsurface Crack Detection
Why a visible-light AOI station and a 1200-1800 nm crack system stay separate tools, with field arithmetic for TGV panels, ABF build-up and via taper.
Flash Measurement System for PCB Inspection
Single-exposure PCB measurement: which board sizes fit a 300 x 200 mm field, why repeatability is not accuracy, and where AOI takes over.
Zoom Lens for Machined Parts: One Camera, Several Magnifications
How a motorized zoom lens covers machined part families: sizing magnification from the part envelope, stand-off in the enclosure and depth of field versus feature height.
Flash Measurement System for Semiconductor Wafer Inspection
Single-field flash measurement on wafers: dual-magnification telecentric optics, field calibration, the 0.02L accuracy term, and where a 300 mm wafer stops fitting.
Zoom Lens for EV Battery Weld Inspection: FOV and Magnification
How to size a zoom lens for EV battery weld inspection: turning seam width into FOV, 6.5X and 12.5X working distance, depth of field, and RS-232 recipe switching.
Telecentric Lenses for Semiconductor Inspection: Model Selection by the Numbers
Telecentric optics keep magnification constant across wafer, chip and package inspection. See verified POMEAS specs, magnification selection and coaxial lighting options.
Image Dimension Measurement System | IMAGE 3 Guide
What an image dimension measurement system is, how the POMEAS IMAGE 3 series is specified, and how to pick the right model by range, repeatability and height measurement.
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