850nm Confocal Displacement Sensor with ±25mm Range

SFS-D500100 is the ultra-large-range spectral confocal displacement sensor with 100 mm reference distance, ±25 mm measuring range, 850 nm repeatability and <±5 μm linearity error.

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Product Overview

POMEAS SFS-D500100 is the ultra-large-range spectral confocal displacement sensor of the SFS series with a 100 mm reference distance, ±25 mm measuring range, 850 nm repeatability and <±5 μm linearity error. The ±25 mm range covers targets with very large height variation, and the 100 mm reference distance provides ample mounting and travel clearance; the Φ60×217.3 mm body weighs about 1154 g, suited to fixed-station installation.

SFS-D500100 spectral confocal displacement sensor

Key Features

850 nm repeatability, linearity error <±5 μm
±25 mm ultra-large range, 50 mm total travel
100 mm reference distance for ample clearance
Φ25/50 μm spot
±9.5° measuring angle
Minimum measurable thickness 5% F.S., supports transparent materials
IP40

Technical Specifications

Product Model	SFS-D500100
Sensor Type	Chromatic Confocal Displacement Sensor
Reference Distance	100 mm
Measuring Range	±25 mm
Measuring Angle	±9.5°
Spot Diameter	Φ25/50 μm
Repeatability	850 nm
Linearity Error	<±5 μm
Probe Size	Φ60×217.3 mm
Weight	1154 g
Minimum Measurable Thickness	5% of F.S.
Temperature Characteristic	<0.03% F.S./°C
Protection Rating	IP40
Measurement Method	Non-contact Optical Measurement
Application	Ultra-Large-Range Displacement and Height Measurement

Applications

Ideal for ultra-large-range displacement and height measurement, large-height-variation surface contour inspection, transparent material thickness measurement and step inspection.

SFS-D500100 application

FAQ

How large is the measuring range of the SFS-D500100?

Measuring range ±25 mm (50 mm total travel), one of the largest in the SFS series, with a 100 mm reference distance.

What is the repeatability?

Repeatability is 850 nm with a linearity error of <±5 μm.

What applications is it suitable for?

Ultra-large-range displacement and height measurement, large-height-variation surface contour inspection and transparent material thickness measurement.