The POMEAS HM series is a family of online projection image measuring heads. Each head projects collimated green LED light past the product, images the resulting shadow on a CMOS receiver, and measures the silhouette — outer diameter, width, height, corner radii and other geometry — while the product is moving, without stopping the line. Five heads cover measurement fields from 6 mm to 120 mm. This page gives the published figures for each, explains the optical design that makes the family stable, and sets out the selection logic.
| Model | Measuring range | Repeatability | Position measurement accuracy | Positioning in the family |
|---|---|---|---|---|
| HM-1006 | φ6 mm | ±0.03 µm | ±0.2 µm | High-accuracy model |
| HM-1015 | φ15 mm | ±0.05 µm | ±0.3 µm | High-accuracy model |
| HM-1040 | φ40 mm | ±0.08 µm | ±1.0 µm | Standard model |
| HM-1065 | φ65 mm | ±0.1 µm | ±1.2 µm | Wide-field model |
| HM-1120 | φ120 mm | ±0.2 µm | ±2.5 µm | Extra-wide-field model |
Read the pattern before you read the numbers: field of view and achievable accuracy move in opposite directions. The smallest head gives the tightest figures because the same receiver resolves a smaller field more finely. Selecting a head is therefore a question of what is the largest feature you must see, and what tolerance must you hold on it — not of buying the best number on the sheet.
The ±0.03 µm repeatability published for the HM-1006 is 30 nanometres. That is a manufacturer's specification-table figure and the test conditions — environment, sample count, artefact, integration time — are not stated in the material we hold. It should be read as an instrument capability under defined laboratory conditions, not as an achievable production tolerance. On a real line, achievable tolerance is set by product presentation, vibration, temperature and contamination as much as by the head. Any figure quoted here should be confirmed against your own artefact before it enters a control plan. This is the same discipline described in calibration and measurement stability.
Three elements of the design produce the stability:
The comparison between a telecentric and a conventional lens — and when each is justified — is set out in measuring shaft outer diameter with a telecentric lens.
The family uses an exposure of 35 microseconds. At that exposure, a product moving through the field is effectively frozen, so the shadow is captured without motion blur and the line does not need to pause or index. This is the single biggest operational difference from a bench measuring system: the part is measured in transit. The trade-off is that a very short exposure needs sufficient illumination, which is why the transmitter uses a dedicated green LED source rather than ambient or general lighting.
The manufacturer states that a single capture can output up to 100 items — outer diameter, width, height, corner radii and other drawing-indicated dimensions — and that the same capture can also assess defect-type features such as foreign matter, burrs and chips. Two caution flags. First, "up to 100 items" is a software capability statement about how many dimensions can be evaluated from one silhouette; it is not a statement that any 100 tolerances can be held to the same accuracy. Second, defect detection from silhouette works for defects that change the outline — a burr protruding from the edge — and not for defects that only change surface appearance inside the outline. The capability boundary is discussed further in what one-shot multi-dimension measurement really returns.
The datasheet names carbon film resistors, heat sinks, drills and cylindrical parts. These share a profile that suits silhouette measurement: a consistent cross-section presented to the beam, dimensions that are defined by the outline, and production rates high enough that stopping to measure is not acceptable.
The HM-1040, with a φ40 mm field, is the smallest head that contains a 30 mm object in one view. Its published figures are ±0.08 µm repeatability and ±1.0 µm position measurement accuracy. Do not select the HM-1015 (φ15 mm) and attempt to cover the part in two captures — stitching fields reintroduces the positioning error you were trying to avoid.
The receiver resolves a fixed number of pixels. Spread that over a 6 mm field and each dimension is sampled more finely than the same receiver spread over 120 mm. Smaller field, finer resolution, tighter repeatability — which is why the selection starts from the largest feature, not from the best headline number.
It is a manufacturer's specification-table figure for the HM-1006, published without test conditions in the material we hold. Treat it as instrument capability under defined conditions. Production tolerance depends on presentation, vibration, temperature and window cleanliness as well.
Yes. The 35 µs exposure freezes the product, so the head measures in transit and the line does not need to stop or index for the capture.
Both use transmitted light and a shadow. The LM-1030 is a dedicated diameter gauge for 0.3 to 30 mm stock at 2400 samples per second. The HM heads are image measuring heads that return a full set of geometry — diameter, width, height, radii — across fields from 6 mm to 120 mm. The principle-level comparison is in inline diameter measurement methods.
Only those that alter the silhouette — burrs, chips, foreign matter on the edge. A scratch or stain entirely inside the outline does not change the shadow and will not be reported by this method.
The manufacturer lists swing during rotation and workpiece position coordinates among the measurable items, so yes — provided the swing manifests as a change in the shadow position, which it does for a part rotating in the beam.
Tell us the largest dimension you must capture in one field, the tolerance you must hold, the line speed and the material. We can confirm which HM head fits, or whether the job is better served by a dedicated diameter gauge such as the LM-1030 or by an offline one-click system such as IMAGE 3.
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